@article{4049,
  title = "ATPG for reversible circuits using technology-related fault models",
  author = "J.S. Allen, J.D. Biamonte and M. Perkowski",
  year = "2005",
  howpublished = "Proc.",
  journal = "Proc. 7th International Symposium on Representations and Methodology of Future Computing Technologies",
  keywords = "Design validation and verification, Test Set Generation, Reversible Computing, CMOS Technology",
  month = "Sep",
  pages = "8",
  url = "http://citeseerx.ist.psu.edu/viewdoc/download?doi=10.1.1.83.6049&rep=rep1&type=pdf",
  doi = "10.1.1.83.6049(",
}