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Learning Concise Models from Long Execution Traces

Natasha Yogananda Jeppu‚ Thomas Melham‚ Daniel Kroening and John O'Leary

Book Title
57th ACM/IEEE Design Automation Conference‚ DAC 2020‚ San Francisco‚ CA‚ USA‚ July 20–24‚ 2020
Pages
1–6
Publisher
IEEE Press
Year
2020