Analysis of ramped square−wave voltammetry in the frequency domain
DJ Gavaghan‚ D. Elton‚ KB Oldham and AM Bond
We present a new approach to the analysis of square-wave voltammetry in the frequency domain. By extending our earlier work (J. Electroanal. Chem. 480 (2000) 133) on the numerical simulation of ac sine wave voltammetry, we are able to solve the governing equations when a square waveform of any amplitude is superimposed onto a linearly varying dc potential which is swept at a finite scan rate. By considering the numerical results in the frequency domain by using the fast Fourier transform (FFT) method, we are able to develop a very simple and general form of analysis which will theoretically allow consideration of reaction phenomena over a very wide range of timescales using a single potential sweep.