Lihao Liang : Publications
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@inproceedings{Liang:2018:VTB,
title = "Verification of Tree-Based Hierarchical {Read-Copy Update} in the {Linux Kernel}",
author = "Lihao Liang and Paul E. McKenney and Daniel Kroening and Tom Melham",
year = "2018",
booktitle = "2018 Design, Automation {\&} Test in Europe Conference {\&} Exhibition, {DATE} 2018, Dresden, Germany, March 19--23, 2018",
note = "To appear.",
url = "http://www.cs.ox.ac.uk/tom.melham/pub/Liang-2018-VTB.pdf",
}
@article{Liang:2017:EVL,
title = "Effective Verification for Low-Level Software with Competing Interrupts",
author = "Lihao Liang and Tom Melham and Daniel Kroening and Peter Schrammel and Michael Tautschnig",
year = "2017",
issn = "1539-9087",
journal = "ACM Transactions on Embedded Computing Systems",
month = "December",
number = "2",
pages = "36:1--36:26",
publisher = "ACM",
url = "http://www.cs.ox.ac.uk/tom.melham/pub/Liang-2017-EVL.pdf",
volume = "17",
doi = "10.1145/3147432",
}
@article{LiangTreeRCU16,
title = "Verification of the Tree-Based Hierarchical Read-Copy Update in the Linux Kernel",
author = "Lihao Liang and Paul E. McKenney and Daniel Kroening and Tom Melham",
year = "2016",
journal = "CoRR",
month = "October",
url = "http://arxiv.org/abs/1610.03052",
volume = "abs/1610.03052",
}
@inproceedings{LiangDATE15,
title = "Effective Verification of Low-Level Software with Nested Interrupts",
author = "Kroening, Daniel and Liang, Lihao and Melham, Tom and Schrammel, Peter and Tautschnig, Michael",
year = "2015",
booktitle = "Design, Automation and Test in Europe (DATE)",
isbn = "978-3-9815370-4-8",
pages = "229--234",
publisher = "EDA Consortium",
}
@inproceedings{Horn:2013:FCL,
title = "Formal Co-Validation of Low-Level Hardware/Software Interfaces",
author = "Alex Horn and Michael Tautschnig and Celina Val and Lihao Liang and Tom Melham and Jim Grundy and Daniel Kroening",
year = "2013",
booktitle = "{FMCAD} 2013: Formal Methods in Computer-Aided Design: {P}ortland, {O}regon, {USA}, 20--23 {O}ctober 2013",
editor = "Barbara Jobstmann and Sandip Ray",
isbn = "978-0-9835678-3-7/13",
pages = "121--128",
publisher = "IEEE",
}